ForewordIntroductionScopeNormative referencesTerms, definitions and symbolsTerms and definitionsSymbolsTheoretical relationshipsFourier transform of the image of a (static) slit objectGeneral caseSpecial casesGeneralCut-off spatial frequency of |F(r)| is less than or equal to the Nyquist frequency 1/(2a)Cut-off spatial frequency of |F(r)| is less than or equal to twice the Nyquist frequency (i.e. 1/a)Fourier transform of the output from a single sampling aperture for a slit object scanned across the apertureFourier transform of the average LSF for different positions of the slit objectMethods of measuring the MTFs associated with sampled imaging systemsGeneralRange of applicationAdditional measurement considerationsSpecifying the relevant MTFTest conditionsTest azimuthDetector arrays and raster scan devicesFibre-optic face plates, channel multipliers and similar devicesMeasurement of system MTF, T(r) of a sampled imaging device or complete systemMeasurement with cut-off spatial frequency of |F(r)| less than the Nyquist frequency — Applicable to most types of deviceMeasurement with the cut-off spatial frequency of |F(r)| less than or equal to 1/a, i.e. twice the Nyquist frequencyMeasurement from the average LSF for different positions of the slit object relative to the sampling array using a static slit objectMeasurement from the average LSF for different positions of the slit object relative to the sampling array using a scanning slit objectMeasurement of the MTF of the sampling aperture, TGeneralMeasurement from the output of a single sampling apertureMethod of measuring the aliasing function, the aliasing ratio and the aliasing potentialBackground theory (informative)Sampled systems and isoplanatismExplanation of basic equationsGeneralCut-off spatial frequency of |F(r)| is less than or equal to the Nyquist frequency 1/(2a)Cut-off spatial frequency of |F(r)| is less than or equal to twice the Nyquist frequency (i.e. 1/a)Fourier transform of the output from a single sampling aperture for a slit object scanned across the apertureFourier transform of the average LSF for different positions of the slit objectAliasing in sampled imaging systems (informative)GeneralThe source of aliasingMeasures of aliasingGeneralAliasing functionAliasing ratioAliasing potentialBibliography