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Draft standard [WITHDRAWN]

DIN EN 60749-41:2017-04 - Draft

Semiconductor devices - Mechanical and climatic test methods - Part 41: Reliability testing methods of non-volatile memory devices (IEC 47/2325/CD:2016)

German title
Halbleiterbauelemente - Mechanische und klimatische Prüfverfahren - Teil 41: Zuverlässigkeitsprüfverfahren für nichtflüchtige Speicher-Bauelemente (IEC 47/2325/CD:2016)
Date of issue
2017-03-24
Publication date
2017-04
Original language
German, English
Pages
35

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Date of issue
2017-03-24
Publication date
2017-04
Original language
German, English
Pages
35
DOI
https://dx.doi.org/10.31030/2641439

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ICS
31.080.01
DOI
https://dx.doi.org/10.31030/2641439
Replacement amendments

This document has been replaced by: DIN EN IEC 60749-41:2023-03 .

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