Draft standard
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OVE EN IEC 60749-15:2019-08-15 - Draft
Semiconductor devices - Mechanical and climatic test methods - Part 15: Resistance to soldering temperature for through-hole mounted devices (IEC 47/2575/CDV) (english version)
German title
Halbleiterbauelemente - Mechanische und klimatische Prüfverfahren - Teil 15: Beständigkeit gegen Löttemperatur bei Bauelementen zur Durchsteckmontage (IEC 47/2575/CDV) (englische Fassung)
Publication date
2019-08-15
Original language
English
Pages
12
Publication date
2019-08-15
Original language
English
Pages
12
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