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Draft standard 2019-02-01

OVE EN IEC 62047-35:2019-02-01 - Draft

Semiconductor devices - Micro-electromechanical devices - Part 35: Test method of electrical characteristics under bending deformation for flexible and foldable electro-mechanical devices (IEC 47F/320/CDV) (english version)

Publication date
2019-02-01
Original language
English

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Publication date
2019-02-01
Original language
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