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Dear Customer,

Monday is the day: 

Beuth Verlag will become DIN Media. 

You can find out more about our new name and the reasons behind it here.

We ask for your understanding that we will therefore not be available for a short time on Sunday. In addition, no orders can be placed on Sunday.
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Beuth Verlag

Standards Worldwide
Standards Worldwide
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Standard [CURRENT] 1983-11

DIN 1715-1:1983-11
Thermostat metals; technical delivery conditions

from 49.20 EUR VAT included

from 45.98 EUR VAT excluded

Standard [CURRENT] 1983-11

DIN 1715-2:1983-11
Thermostat metals; testing the specific thermal curvature

from 34.60 EUR VAT included

from 32.34 EUR VAT excluded

Standard [CURRENT] 1987-08

DIN 50450-1:1987-08
Testing of materials for semiconductor technology; determination of impurities in carrier gases and doping gases; determination of water impurity in hydrogen, oxygen, nitrogen, argon and helium by using a diphosphorus pentoxide cell

from 34.60 EUR VAT included

from 32.34 EUR VAT excluded

Standard [CURRENT] 1991-03

DIN 50450-2:1991-03
Testing of materials for semiconductor technology; determination of impurities in carrier gases and doping gases; determination of oxygen impurity in N₂, Ar, He, Ne and H₂ by using a galvanic cell

from 34.60 EUR VAT included

from 32.34 EUR VAT excluded

Standard [CURRENT] 1993-09

DIN 50450-4:1993-09
Testing of materials for semiconductor technology; determination of impurities in carrier gases and dopant gases; determination of C₁-C₃-hydrocarbons in nitrogen by gas-chromatography

from 34.60 EUR VAT included

from 32.34 EUR VAT excluded

Standard [CURRENT] 2021-07

DIN 50450-9:2021-07
Testing of materials for semiconductor technology - Determination of impurities in carrier gases and dopant gases - Part 9: Determination of oxygen, nitrogen, carbonmonoxide, carbondioxide, hydrogen and C₁-C₃-hydrocarbons in gaseous hydrogen chloride by gaschromatography

from 42.10 EUR VAT included

from 39.35 EUR VAT excluded

Standard [CURRENT] 2014-11

DIN 50451-3:2014-11
Testing of materials for semiconductor technology - Determination of traces of elements in liquids - Part 3: Determination of 31 elements in high-purity nitric acid by ICP-MS

from 77.90 EUR VAT included

from 72.80 EUR VAT excluded

Draft standard 2024-01

DIN 50451-4:2024-01 - Draft
Testing of materials for semiconductor technology - Determination of trace elements in liquids - Part 4: Determination of 34 elements in ultra pure water by mass spectrometry with inductively coupled plasma (ICP-MS)

from 70.50 EUR VAT included

from 65.89 EUR VAT excluded

Standard [CURRENT] 2007-02

DIN 50451-4:2007-02
Testing of materials for semiconductor technology - Determination of trace elements in liquids - Part 4: Determination of 34 elements in ultra pure water by mass spectrometry with inductively coupled plasma (ICP-MS)

from 63.80 EUR VAT included

from 59.63 EUR VAT excluded

Standard [CURRENT] 2022-08

DIN 50451-5:2022-08
Testing of materials for semiconductor technology - Determination of trace elements in liquids - Part 5: Guideline for the selection of materials and testing of their suitability for apparatus for sampling and sample preparation for the determination of trace elements in the range of micrograms per kilogram and nanograms per kilogram

from 56.60 EUR VAT included

from 52.90 EUR VAT excluded

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