Standard
[CURRENT]
ASTM E 1162:2011
Standard Practice for Reporting Sputter Depth Profile Data in Secondary Ion Mass Spectrometry (SIMS)
- German title
- Sekundärionenmassenspektrometer; Angaben für den Prüfbericht
- Publication date
-
2011
reapproved: 2019
- Original language
-
English
- Pages
- 3
- Publication date
-
2011
reapproved: 2019
- Original language
-
English
- Pages
- 3
- DOI
- https://dx.doi.org/10.1520/E1162-11R19
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DOI
https://dx.doi.org/10.1520/E1162-11R19
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