Standard
[CURRENT]
ASTM E 1438:2011
Standard Guide for Measuring Widths of Interfaces in Sputter Depth Profiling Using SIMS
- German title
- Richtlinie für die Messung von Schnittstellenbreiten bei der Aufstäubungstiefenprofilierung mit Hilfe der Sekundärionen-Massenspektroskopie
- Publication date
-
2011
reapproved: 2019
- Original language
-
English
- Pages
- 3
- Publication date
-
2011
reapproved: 2019
- Original language
-
English
- Pages
- 3
- DOI
- https://dx.doi.org/10.1520/E1438-11R19
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DOI
https://dx.doi.org/10.1520/E1438-11R19
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