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Standard [CURRENT]

ASTM E 766:2014

Standard Practice for Calibrating the Magnification of a Scanning Electron Microscope

German title
Eichung der Vergrößerung von REM (Rasterelektronenmikroskopen) unter Verwendung der Eichprobe NBS-SRM-484
Publication date
2014 reapproved: 2019
Original language
English
Pages
6

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Publication date
2014 reapproved: 2019
Original language
English
Pages
6
DOI
https://dx.doi.org/10.1520/E0766-14R19

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ICS
37.020
DOI
https://dx.doi.org/10.1520/E0766-14R19
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