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Dear Customer,

This year, on the occasion of our 100th anniversary, we will be positioning ourselves for the future as part of the DIN Group with a new name. 

And so as of April 22, 2024

Beuth Verlag will become DIN Media. 

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Standard [WITHDRAWN] Article is not orderable

ASTM F 1262M:2014

Standard Guide for Transient Radiation Upset Threshold Testing of Digital Integrated Circuits (Metric)

German title
Richtlinie für die Prüfung der transienten Strahlungs-Kippschwelle integrierter Digitalschaltungen
Publication date
2014
Original language
English
Pages
6
Publication date
2014
Original language
English
Pages
6
DOI
https://dx.doi.org/10.1520/F1262M-14

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ICS
31.200
DOI
https://dx.doi.org/10.1520/F1262M-14
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