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ASTM F 1467:2011

Standard Guide for Use of an X-Ray Tester (≈10 keV Photons) in Ionizing Radiation Effects Testing of Semiconductor Devices and Microcircuits

German title
Anwendung eines Röntgenstrahlprüfgerätes (etwa gleichwertig 10-keV-Photonen) für die Prüfung der Wirkungen ionisierender Strahlung auf Bauelemente der Mikroelektronik
Publication date
2011
Original language
English
Pages
18
Publication date
2011
Original language
English
Pages
18

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Replacement amendments

This document has been replaced by: ASTM F 1467:2018 .

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