To our valued customers,

Monday is the day:

Beuth Verlag will become DIN Media.

You can find out more about our new name and the reasons behind it here.

We ask for your understanding that, due to this change, we will be temporarily unavailable on Sunday. It will also not be possible to place any orders on Sunday.

But we will be there for you from Monday onwards with our new name.

Yours sincerely,
Beuth Verlag

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ASTM F 744:1981

Test Method for Measuring Dose Rate Threshold for Upset of Digital Integrated Circuits

German title
Messung der die Störung integrierter digitaler Schaltkreise bewirkenden Grenzdosisrate
Publication date
1981
Original language
English
Pages
8
Publication date
1981
Original language
English
Pages
8

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