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ASTM F 744M:2016

Standard Test Method for Measuring Dose Rate Threshold for Upset of Digital Integrated Circuits (Metric)

German title
Messung der die Störung integrierter digitaler Schaltkreise bewirkenden Grenzdosisrate
Publication date
2016
Original language
English
Pages
7
Publication date
2016
Original language
English
Pages
7
DOI
https://dx.doi.org/10.1520/F0744M-16

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ICS
31.200
DOI
https://dx.doi.org/10.1520/F0744M-16
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