&nbsp
International Customer Service
Phone +49 30 2601-2759
Fax +49 30 2601-1263

Standard [WITHDRAWN] 2010 Article is not orderable

ASTM F 996:2010

Standard Test Method for Separating an Ionizing Radiation-Induced MOSFET Threshold Voltage Shift Into Components Due to Oxide Trapped Holes and Interface States Using the Subthreshold Current-Voltage Characteristics

Publication date
2010
Accessibility
Original language
English
Publication date
2010
Accessibility
Original language
English

Quick delivery via download or delivery service

Buy securely with a credit card or pay upon receipt of invoice 

All transactions are encrypted

Amendments

This document has been replaced by:: ASTM F 996:2011 .

Loading recommended items...
Loading recommended items...
Loading recommended items...
Loading recommended items...