Standards Worldwide
Standards Worldwide
Phone +49 30 58885700-07
Standard [WITHDRAWN] Article is not orderable
ASTM F 996:2011
Standard Test Method for Separating an Ionizing Radiation-Induced MOSFET Threshold Voltage Shift Into Components Due to Oxide Trapped Holes and Interface States Using the Subthreshold Current-Voltage Characteristics
- German title
- Prüfverfahren zur Aufteilung einer durch Oxidhaftlöcher und Schnittstellenzustände bedingten gesamtdosisinduzierten MOSFET-Schwellenspannungsverschiebung in Komponenten mit Hilfe der Teilschwellenwerttechnik
- Publication date
- 2011 reapproved: 2018
- Original language
- English
- Pages
- 7
- Publication date
- 2011 reapproved: 2018
- Original language
- English
- Pages
- 7
- DOI
- https://dx.doi.org/10.1520/F0996-11R18
Product information on this site:
Quick delivery via download or delivery service
Buy securely with a credit card or pay upon receipt of invoice
All transactions are encrypted
ICS
31.080.30
DOI
https://dx.doi.org/10.1520/F0996-11R18
Loading recommended items...
Loading recommended items...
Loading recommended items...
Loading recommended items...