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Standard [CURRENT]

BS EN 62047-15:2015-07-31

Semiconductor devices. Micro-electromechanical devices. Test method of bonding strength between PDMS and glass

German title
Halbleiterbauelemente. Bauelemente der Mikrosystemtechnik. Prüfverfahren zur Bondqualität zwischen PDMS und Glas
Publication date
2015-07-31
Original language
English
Pages
18

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Publication date
2015-07-31
Original language
English
Pages
18

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