We use cookies to make our websites more user-friendly and to continuously improve them. If you continue to use the website, you consent to the use of cookies. You can find more information in our privacy statement and our cookie guidelines.

Dear Customer,

This year, on the occasion of our 100th anniversary, we will be positioning ourselves for the future as part of the DIN Group with a new name. 

And so as of April 22, 2024

Beuth Verlag will become DIN Media. 

You can find out more about our new name and the reasons behind it here.

Yours sincerely,
Beuth Verlag

Standards Worldwide
Standards Worldwide
Phone +49 30 58885700-07

Standard [WITHDRAWN] Article is not orderable

BS ISO 15632:2012-08-31

Microbeam analysis. Selected instrumental performance parameters for the specification and checking of energy-dispersive X-ray spectrometers for use in electron probe microanalysis

Publication date
2012-08-31
Original language
English
Pages
22
Publication date
2012-08-31
Original language
English
Pages
22

Product information on this site:

Quick delivery via download or delivery service

Buy securely with a credit card or pay upon receipt of invoice

All transactions are encrypted

Replacement amendments

This document has been replaced by: BS ISO 15632:2021-02-22 .

Loading recommended items...
Loading recommended items...
Loading recommended items...