DIN EN 60749-18:2003-09

Semiconductor devices - Mechanical and climatic test methods - Part 18: Ionizing radiation (total dose) (IEC 60749-18:2002); German version EN 60749-18:2003

German title: Halbleiterbauelemente - Mechanische und klimatische Prüfverfahren - Teil 18: Ionisierende Strahlung (Gesamtdosis) (IEC 60749-18:2002); Deutsche Fassung EN 60749-18:2003
Publication date: 2003-09
Original language: German
Pages: 15
Note: The publisher recommends this document in lieu of the withdrawn document DIN 41881-2:1978-06 , for which no replacement is available.

Publication date: 2003-09
Original language: German
Pages: 15
Note: The publisher recommends this document in lieu of the withdrawn document DIN 41881-2:1978-06 , for which no replacement is available.
DOI: https://dx.doi.org/10.31030/9503387

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ICS

31.080.01

DOI

https://dx.doi.org/10.31030/9503387

Replacement amendments

This document has been replaced by: DIN EN IEC 60749-18:2020-02 .

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