DIN EN 60749-6:2003-04

Semiconductor devices - Mechanical and climatic test methods - Part 6: Storage at high temperature (IEC 60749-6:2002); German version EN 60749-6:2003

German title: Halbleiterbauelemente - Mechanische und klimatische Prüfverfahren - Teil 6: Lagerung bei hoher Temperatur (IEC 60749-6:2002); Deutsche Fassung EN 60749-6:2003
Publication date: 2003-04
Original language: German
Pages: 7
Note: The publisher recommends this document in lieu of the withdrawn document DIN 41881-2:1978-06 , for which no replacement is available.

Publication date: 2003-04
Original language: German
Pages: 7
Note: The publisher recommends this document in lieu of the withdrawn document DIN 41881-2:1978-06 , for which no replacement is available.

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Replacement amendments

This document replaces DIN EN 60749:2002-09 .

This document has been replaced by: DIN EN 60749-6:2017-11 .

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