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Standard [CURRENT]

DIN EN 62373:2007-01

Bias-temperature stability test for metal-oxide, semiconductor, field-effect transistors (MOSFET) (IEC 62373:2006); German version EN 62373:2006

German title
Stabilitätsprüfung unter Temperatur-Spannungs-Beanspruchung für Feldeffekttransistoren mit Metalloxid-Halbleiter (MOSFET) (IEC 62373:2006); Deutsche Fassung EN 62373:2006
Publication date
2007-01
Original language
German
Pages
14

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Publication date
2007-01
Original language
German
Pages
14
DOI
https://dx.doi.org/10.31030/9778546

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ICS
31.080.30
DOI
https://dx.doi.org/10.31030/9778546

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