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EIA JESD 51-51:2012-04

Implementation of the Electrical Test Method for the Measurement of Real Thermal Resistance and Impedance of Light-Emitting Diodes with Exposed Cooling

Publication date
2012-04
Original language
English
Pages
34
Publication date
2012-04
Original language
English
Pages
34

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Replacement amendments

This document has been replaced by: EIA JESD 51-51A:2022-10 .

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