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Standard [WITHDRAWN] Article is not orderable

NF C96-022-18:2003-05-01

NF EN 60749-18:2003-05-01

Semiconductor devices - Mechanical and climatic test methods - Part 18: ionizing radiation (total dose)

German title
Halbleiterbauelemente - Mechanische und Klimatische Prüfverfahren - Teil 18: isolierende Strahlung (Gesamtdosis)
Publication date
2003-05-01
Original language
French
Pages
16
Publication date
2003-05-01
Original language
French
Pages
16

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Replacement amendments

This document has been replaced by: NF C96-022-18:2019-05-31; NF EN IEC 60749-18:2019-05-31 .

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