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Standard [CURRENT]

NF C96-022-2:2002-12-01;NF EN 60749-2:2002-12-01

NF EN 60749-2:2002-12-01

Semiconductor devices - Mechanical and climatic test methods - Part 2: low air pressure

German title
Halbleiterbauelemente - Mechanische und Klimatische Prüfverfahren - Teil 2: Niedriger Luftdruck
Publication date
2002-12-01
Original language
French
Pages
9

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Publication date
2002-12-01
Original language
French
Pages
9

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