We use cookies to make our websites more user-friendly and to continuously improve them. If you continue to use the website, you consent to the use of cookies. You can find more information in our privacy statement and our cookie guidelines.

To our valued customers,

At last: 

Beuth Verlag is now DIN Media. 

You can find out more about our new name and the reasons behind it here.

To use our new website without any hiccups, please clear your browser cache. 

Yours sincerely,

DIN Media

Standards Worldwide
Standards Worldwide
Phone +49 30 58885700-07

Standard [CURRENT]

NF C96-022-44:2016-12-23

NF EN 60749-44:2016-12-23

Semiconductor devices - Mechanical and climatic test methods - Part 44: neutron beam irradiated single event effect (SEE) test method for semiconductor devices

German title
Halbleiterbauelemente - Mechanische und klimatische Prüfverfahren - Teil 44: Prüfverfahren zur Einzelereignis-Effekt-Neutronenbestrahlung von Halbleiterbauelementen
Publication date
2016-12-23
Original language
French
Pages
25

Please select

from 118.70 EUR VAT included

from 110.93 EUR VAT excluded

Purchasing options

PDF download

  • 118.70 EUR

Shipment (3-5 working days)

  • 133.20 EUR

Standards Ticker 1
1

Learn more about the standards ticker

Publication date
2016-12-23
Original language
French
Pages
25

Product information on this site:

Quick delivery via download or delivery service

Buy securely with a credit card or pay upon receipt of invoice

All transactions are encrypted

Loading recommended items...
Loading recommended items...
Loading recommended items...
Loading recommended items...