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To our valued customers,

Monday is the day:

Beuth Verlag will become DIN Media.

You can find out more about our new name and the reasons behind it here.

We ask for your understanding that, due to this change, we will be temporarily unavailable on Sunday. It will also not be possible to place any orders on Sunday.

But we will be there for you from Monday onwards with our new name.

Yours sincerely,
Beuth Verlag

Standards Worldwide
Standards Worldwide
Phone +49 30 58885700-07

Standard [CURRENT]

NF C96-050-17:2015-11-14

NF EN 62047-17:2015-11-14

Semiconductor devices - Micro-electromechanical devices - Part 17: bulge test method for measuring mechanical properties of thin films

German title
Halbleiterbauelemente - Bauelemente der Mikrosystemtechnik - Teil 17: Wölbungs-Prüfverfahren zur Bestimmung mechanischer Eigenschaften dünner Schichten
Publication date
2015-11-14
Original language
French
Pages
32

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Publication date
2015-11-14
Original language
French
Pages
32

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