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OEVE/OENORM EN 60749-17:2003-10-01

Semiconductor devices - Mechanical and climatic test methods - Part 17: Neutron irradiation (IEC 60749-17:2003)

German title
Halbleiterbauelemente - Mechanische und klimatische Prüfverfahren - Teil 17: Neutronenbestrahlung (IEC 60749-17:2003)
Publication date
2003-10-01
Original language
German
Pages
7
Publication date
2003-10-01
Original language
German
Pages
7

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Replacement amendments

This document has been replaced by: OVE EN IEC 60749-17:2019-12-01 .

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