&nbsp
International Customer Service
Phone +49 30 2601-2759
Fax +49 30 2601-1263

Standard 2007-03-01

OEVE/OENORM EN 62047-3:2007-03-01

Semiconductor devices - Micro-electromechanical devices - Part 3: Thin film standard test piece for tensile-testing (IEC 62047-3:2006)

German title
Halbleiterbauelemente - Bauteile der Mikrosystemtechnik - Teil 3: Dünnschicht-Standardmikroprobe für die Prüfung der Zugbeanspruchung (IEC 62047-3:2006)
Publication date
2007-03-01
Original language
German

Please select

from 59.50 EUR VAT included

from 55.61 EUR VAT excluded

Purchasing options

PDF download
  • 59.50 EUR

Shipment
  • 74.40 EUR

Subscription 1
Publication date
2007-03-01
Original language
German

Quick delivery via download or delivery service

Buy securely with a credit card or pay upon receipt of invoice 

All transactions are encrypted

Loading recommended items...
Loading recommended items...
Loading recommended items...
Loading recommended items...