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To our valued customers,

Monday is the day:

Beuth Verlag will become DIN Media.

You can find out more about our new name and the reasons behind it here.

We ask for your understanding that, due to this change, we will be temporarily unavailable on Sunday. It will also not be possible to place any orders on Sunday.

But we will be there for you from Monday onwards with our new name.

Yours sincerely,
Beuth Verlag

Standards Worldwide
Standards Worldwide
Phone +49 30 58885700-07

Standard [CURRENT]

SN EN 62047-3:2006-09

Semiconductor devices - Micro-electromechanical devices. Part 3: Thin film standard test piece for tensile-testing

German title
Halbleiterbauelemente - Bauteile der Mikrosystemtechnik. Teil 3: Dünnschicht-Standardmikroprobe für die Prüfung der Zugbeanspruchung
Publication date
2006-09
Original language
German
Pages
7

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Standards Ticker 1
1

Learn more about the standards ticker

2

Endorsement notice without the reference document

Publication date
2006-09
Original language
German
Pages
7

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