&nbsp
International Customer Service
Phone +49 30 2601-2759
Fax +49 30 2601-1263

Standard 2011-04

SN EN 62374-1+CORR:2011-04

Semiconductor devices - Part 1: Time-dependent dielectric breakdown (TDDB) test for inter-metal layers

German title
Halbleiterbauelemente - Teil 1: Prüfung auf zeitabhängigen dielektrischen Durchbruch (TDDB) bei Isolationsschichten zwischen metallischen Leiterbahnen
Publication date
2011-04
Accessibility
Original language
German

Please select

from 86.80 EUR VAT included

from 72.94 EUR VAT excluded

Purchasing options

PDF download
  • 86.80 EUR

Shipment
  • 86.80 EUR

Subscription 1
Publication date
2011-04
Accessibility
Original language
German
Unser Webshop, der schnelle Weg zu Ihren Normen

Quick delivery via download or delivery service

Buy securely with a credit card or pay upon receipt of invoice 

All transactions are encrypted

Loading recommended items...
Loading recommended items...
Loading recommended items...
Loading recommended items...