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UNE-EN 60749-20:2012-07-01
Semiconductor devices - Mechanical and climatic test methods - Part 20: Resistance of plastic encapsulated SMDs to the combined effect of moisture and soldering heat (Endorsed by AENOR in July of 2012.)
- Publication date
- 2012-07-01
- Original language
- English
- Pages
- 31
- Publication date
- 2012-07-01
- Original language
- English
- Pages
- 31
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Replacement amendments
This document has been replaced by: UNE-EN IEC 60749-20:2020-11-01 .
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