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Standard 2017-08-01

UNE-EN 60749-28:2017-08-01

Semiconductor devices - Mechanical and climatic test methods - Part 28: Electrostatic discharge (ESD) sensitivity testing - Charged device model (CDM) - device level (Endorsed by Asociación Española de Normalización in August of 2017.)

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2017-08-01
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2017-08-01
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