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Technical rule [WITHDRAWN] Article is not orderable

EIA JEP 151:2015-09

Test Procedure for the Measurement of Terrestrial Cosmic Ray Induced Destructive Effects in Power Semiconductor Devices

Publication date
2015-09
Original language
English
Pages
24
Publication date
2015-09
Original language
English
Pages
24

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Replacement amendments

This document has been replaced by: EIA JEP 151A:2022-01 .

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