Standard Guide for Use of an X-Ray Tester (≈10 keV Photons) in Ionizing Radiation Effects Testing of Semiconductor Devices and Microcircuits
German title
Anwendung eines Röntgenstrahlprüfgerätes (etwa gleichwertig 10-keV-Photonen) für die Prüfung der Wirkungen ionisierender Strahlung auf Bauelemente der Mikroelektronik
Publication date
2018
Original language
English
Pages
18
Publication date
2018
Original language
English
Pages
18
DOI
https://dx.doi.org/10.1520/F1467-18
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