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Standard [WITHDRAWN]

DIN EN 60749-27:2007-01

Semiconductor devices - Mechanical and climatic test methods - Part 27: Electrostatic discharge (ESD) sensitivity testing - Machine model (MM) (IEC 60749-27:2006); German version EN 60749-27:2006

German title
Halbleiterbauelemente - Mechanische und klimatische Prüfverfahren - Teil 27: Prüfung der Empfindlichkeit gegen elektrostatische Entladungen (ESD) - Machine Model (MM) (IEC 60749-27:2006); Deutsche Fassung EN 60749-27:2006
Publication date
2007-01
Original language
German
Pages
15

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Publication date
2007-01
Original language
German
Pages
15

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Replacement amendments

This document has been replaced by: DIN EN 60749-27:2013-04 .

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