DIN EN 61000-4-6:2014-08; VDE 0847-4-6:2014-08
Title (german) Elektromagnetische Verträglichkeit (EMV) - Teil 4-6: Prüf- und Messverfahren - Störfestigkeit gegen leitungsgeführte Störgrößen, induziert durch hochfrequente Felder (IEC 61000-4-6:2013); Deutsche Fassung EN 61000-4-6:2014
Title (english): Electromagnetic compatibility (EMC) - Part 4-6: Testing and measurement techniques - Immunity to conducted disturbances, induced by radio-frequency fields (IEC 61000-4-6:2013); German version EN 61000-4-6:2014
Document type: Standard
Publication date: 2014-08
This standard contains the German version of the European Standard EN 61000-4-6:2014 and is identical to the fourth edition of the International Standard IEC 61000-4-6 (edition 2013-10). It serves for the description of the method for testing the immunity of electrical and electronic equipment to conducted disturbances induced by radio-frequency fields. Recommended test levels are only given for the range 150 kHz to 80 MHz, whereas no test requirements are specified for the range lower than 150 kHz. In addition to the test levels, specifications for the test equipment, test setup, test procedure, evaluation of the test results and test report are given. With respect to the previous edition, a series of individual modifications have been made. This also includes the editorial revision of the standard, the inclusions of figures into the corresponding clauses as well as the introduction of subheadings and resultant adaptations in the text of the standard. Furthermore, modifications for use of the coupling and decoupling devices and in Annex G was changed that the measurement uncertainty concerns the voltage test level. Finally, the informative Annexes H, I and J have been added that contain information for: - Measurement of AE impedance - Port to port injection - Amplifier compression and non-linearity. The responsible committee is Subcommittee DKE/UK 767.3 "Hochfrequente Störgrößen" ("High frequency disturbances") of the DKE (German Commission for Electrical, Electronic and Information Technologies) at DIN and VDE.
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