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Standards Worldwide
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Standard [CURRENT]

OVE EN IEC 60749-30:2023-03-01

Semiconductor devices - Mechanical and climatic test methods - Part 30: Preconditioning of non-hermetic surface mount devices prior to reliability testing ((IEC 60749-30:2020) EN IEC 60749-30:2020) (german version)

German title
Halbleiterbauelemente - Mechanische und klimatische Prüfverfahren - Teil 30: Behandlung nicht hermetisch verkappter oberflächenmontierbarer Bauelemente vor Zuverlässigkeitsprüfungen ((IEC 60749-30:2020) EN IEC 60749-30:2020) (deutsche Fassung)
Publication date
2023-03-01
Original language
German
Pages
18

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Publication date
2023-03-01
Original language
German
Pages
18

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