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Standard [CURRENT]

BS EN 60749-4:2017-11-28

Semiconductor devices. Mechanical and climatic test methods. Damp heat, steady state, highly accelerated stress test (HAST)

German title
Halbleiterbauelemente. Mechanische und klimatische Prüfverfahren Feuchte Wärme, konstant, Prüfung mit hochbeschleunigter Wirkung (HAST)
Publication date
2017-11-28
Original language
English
Pages
16

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Publication date
2017-11-28
Original language
English
Pages
16

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