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Standard [WITHDRAWN]

DIN 50438-1:1994-09

Testing of materials for semiconductor technology - Determination of impurity content in silicon by infrared absorption - Part 1: Oxygen

German title
Prüfung von Materialien für die Halbleitertechnologie - Bestimmung des Verunreinigungsgehaltes in Silicium mittels Infrarot-Absorption - Teil 1: Sauerstoff
Publication date
1994-09
Original language
German
Pages
10

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Publication date
1994-09
Original language
German
Pages
10

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Replacement amendments

This document replaces DIN 50438-1:1978-01 .

This document has been replaced by: DIN 50438-1:1995-07 .

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