DIN 50451-1:2003-04

Testing of materials for semiconductor technology - Determination of trace elements in liquids - Part 1: Silver (Ag), gold (Au), calcium (Ca), copper (Cu), iron (Fe), potassium (K) and sodium (Na) in nitric acid by AAS

German title: Prüfung von Materialien für die Halbleitertechnologie - Bestimmung von Elementspuren in Flüssigkeiten - Teil 1: Silber (Ag), Gold (Au), Calcium (Ca), Kupfer (Cu), Eisen (Fe), Kalium (K) und Natrium (Na) in Salpetersäure mittels AAS
Publication date: 2003-04
Original language: German
Pages: 8
Note: The issuing body recommends using {0} DIN 50451-3:2014-11 .

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ICS

29.045

DOI

https://dx.doi.org/10.31030/9476120

Replacement amendments

This document replaces DIN 50451-1:1987-10 .

Cooperation at DIN

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