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Standard [CURRENT]

DIN EN 60749-38:2008-10

Semiconductor devices - Mechanical and climatic test methods - Part 38: Soft error test method for semiconductor devices with memory (IEC 60749-38:2008); German version EN 60749-38:2008

German title
Halbleiterbauelemente - Mechanische und klimatische Prüfverfahren - Teil 38: Soft-Error-Prüfverfahren für Halbleiterbauelemente mit Speicher (IEC 60749-38:2008); Deutsche Fassung EN 60749-38:2008
Publication date
2008-10
Original language
German
Pages
14

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Publication date
2008-10
Original language
German
Pages
14
DOI
https://dx.doi.org/10.31030/1459861

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ICS
31.080.01
DOI
https://dx.doi.org/10.31030/1459861

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