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Standard [CURRENT]

SN EN 60749-27+A1:2012-11

Semiconductor devices - Mechanical and climatic test methods - Part 27: Electrostatic discharge (ESD) sensitivity testing - Machine model (MM)

German title
Halbleiterbauelemente - Mechanische und klimatische Prüfverfahren - Teil 27: Prüfung der Empfindlichkeit gegen elektrostatische Entladungen (ESD) - Machine Model (MM)
Publication date
2012-11
Original language
German
Pages
13

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Publication date
2012-11
Original language
German
Pages
13

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Replacement amendments

This document replaces SN EN 60749-27:2006-08 .

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